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Advanced Thin Film Deposition and Analytical Characterization Techniques

Advanced Thin Film Deposition and Analytical Characterization Techniques


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Author(s):Dr. Priti Nana Jadhav and Dr. Pratiksha Navanath Baraskar
Paperback ISBN:978-93-7150-734-9
Ebook ISBN:978-93-7150-758-5
Publisher:AkiNik Publications
Language:English
Pages:114
Publication Year:2026
Publication Date:08/07/2026
Binding:Paperback
DOI:https://doi.org/10.22271/ed.book.3777

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Description

Advanced Thin Film Deposition and Analytical Characterisation Techniques provides a detailed account of state-of-the-art thin film fabrication and analysis techniques for materials science,Chemistry, physics and engineering. The book covers physical and chemical deposition methods such as sputtering, evaporation, spray pyrolysis, sol–gel processing and chemical vapour deposition, and advanced characterisation methods including spectroscopy, microscopy, thermal, surface and electrochemical analysis. The book is intended for students, researchers and professionals who will find the combination of fundamental principles and practical applications in nanotechnology, energy devices, coatings and semiconductor materials useful.

Reviews

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Prof. Patrick Anderson
  August 28, 2026

This book is distinguished by its meticulous and comprehensive survey of both historical antecedents and contemporary applications. The vastness of the material covered is matched only by the precision of the analysis.

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